Preferred Term:
atomic force microscopy
Definition:
A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.
Concept Schemes:
NALT Core
NALT Full
NALT Full
Broader Concept:
Entry Terms:
- magnetic force microscopy
- piezoresponse force microscopy
- scanning force microscopy
URI:
https://lod.nal.usda.gov/nalt/188543
Download this Concept:
RDF/XMLCreated 2012-07-10, last modified 2020-10-05
Closely Matching Concepts:
Exactly Matching Concepts: