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NALT Concept Space
U.S. Department of Agriculture

NALT Full

Concept information

  1. Research, Technology, Methods
  2. methodology
  3. microscopy
  4. scanning probe microscopy
  5. atomic force microscopy

Preferred term

atomic force microscopy

Type

  • Topic

Definition

  • Information A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.

    Source: Medical Subject Headings 2012

    Type: Concept definition

Broader concept

Synonyms

  • magnetic force microscopy
  • piezoresponse force microscopy
  • scanning force microscopy

In other languages

URI

https://lod.nal.usda.gov/nalt/188543

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RDF/XML TURTLE JSON-LD Created 7/10/12, last modified 10/5/20